Design and Analysis of Accelerated Tests for Mission Critical Reliability.
Boca Raton: Chapman & Hall/ CRC, 2004. 236 pp, 8vo. Boards. Previous seller's price pencilled heavily to ffep, otherwise a fine, clean and tight copy. Near Fine Boards 1584884711 (Item ID: 124649)
- More: MATHEMATICS
- By This Author: LuValle, Michael J., Bruce G. Lefevre and SriRaman Kannan.