Digital Noise Monitoring of Defect Origin.

Aliev, Telman.

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New York: Springer Science + Business Media, 2007. 223 pp. 8vo. Boards. Volume 2 in the Lectures Notes in Electical Engineering series. Bumping to corners and sp. head. Sl. wear to sp. foot. Very Good Hardcover 9780387717531 (Item ID: 144896)



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