Digital Noise Monitoring of Defect Origin.

New York: Springer Science + Business Media, 2007. Hardcover. 223 pp. 8vo. Boards. Volume 2 in the Lectures Notes in Electical Engineering series. Bumping to corners and sp. head. Sl. wear to sp. foot. Very Good. Item #144896
ISBN: 9780387717531

Price: $45.00 save 30% $31.50

See all items in MATHEMATICS
See all items by