Design and Analysis of Accelerated Tests for Mission Critical Reliability.

LuValle, Michael J., Bruce G. Lefevre and SriRaman Kannan.

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Price: $95.00

Boca Raton: Chapman & Hall/ CRC, 2004. 236 pp, 8vo. Boards. Previous seller's price pencilled heavily to ffep, otherwise a fine, clean and tight copy. Near Fine Boards 1584884711 (Item ID: 124649)

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